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Introduction to analytical electron microscopy edited by John J. Hren, Joseph I. Goldstein and David C. Joy
Material type:
TextLanguage: English Publication details: New York : Springer Science, 1979 Description: xv, 601pISBN: 9781475755831Subject(s): Electron microscopy | Surfaces (Physics) | Electron optics | Film X-ray microanalysis | EDS quantitationDDC classification: 502.8
| Item type | Current library | Call number | Status | Date due | Barcode |
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Books
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Central Library (Sunabeda Campus) General Section | 502.8 HRE (Browse shelf(Opens below)) | Available | 41606 |